Contact Resistance Measurement Using Labview and Ni Pci 6221 Data Acquisition System
Contact Resistance Measurement Using Labview and Ni Pci 6221 Data Acquisition System

Summary/Abstract: In this paper is presented a method for contact resistance measurement, using LabVIEW and NI PCI 6221 data acquisition system. For contact resistance measurement we use the indirect method of ammeter and voltmeter. In LabVIEW we have made the graphical interface wich enables user to store the data acquire in a .xls file. Also, the graphical interface offers the possibility of establishing a minimum contact resistance, the user can be warned visually is this value exceeded. To increase measurement accuracy program calculates the average value of the data set acquired at each time interval specified by the user. For measure the voltage we use NI PCI 6221 acquisition data board with ± 10 V domain, and for measure current intensity we use a shunt resistance.

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