FOURIER-TRANSFORM INFRARED SPECTROSCOPY (FT-IR) AND X-RAY DIFFRACTOMETRY (XRD) AS METHODS FOR DISCRIMINATING AMBER AND AMBER-LIKE MATERIALS FROM THE ROMANIAN MARKET
FOURIER-TRANSFORM INFRARED SPECTROSCOPY (FT-IR) AND X-RAY DIFFRACTOMETRY (XRD) AS METHODS FOR DISCRIMINATING AMBER AND AMBER-LIKE MATERIALS FROM THE ROMANIAN MARKET

Summary/Abstract: Amber and amber-like material are often found our days in the Romaniangemstone exhibitions. Fake amber is more and more difficult to detect, because modernmanufactured products made of natural resins and/or polymers are so perfect, that they canproduce same esthetic effects of the transparent and colored–like amber pieces.Macroscopically, they can not be separated from amber without a good personal experienceor only applying gemological classic tests. So, modern physico-chemical methods, as Fouriertransform infrared spectroscopy (FT-IR) and X-ray diffractometry (XRD) are applied, fordiscriminating amber and forgeries.

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